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    Panscan

    Panscan Freedom SPM

    All the advantages of LT, none of the constraints!

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    RHK Technology

    Explore with Confidence

    R9 controller. Your single-box, expandable solution for universal SPM control

    Over 200 Units Shipped!

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    RHK Technology

    Beetle VT SPM

    The most mechanically and thermally-stable VT SPM available. Surpass the limits of UHV SPM performance!

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RHK Nanoscience using R9plus - PanScan Freedom - Beetle UHV VT STM
Featured Product
PanScan Freedom Cryogen-Free LT AFM/STM
New Standard in cryogen-free LT STM Systems for Nanoscience. LEARN MORE
Image of the
Month!
September 2017
Scanning Tunneling Microscopy Observation of Phonon Condensate
Microscope used: UHV Beetle 300 STM
Reference: Scientific reports 7 (2017): 43451.
Credit: Igor Altfeder, Andrey A. Voevodin, Michael H. Check, Sarah M. Eichfeld, Joshua A. Robinson & Alexander V. Balatsky
Pan scan, Quad Probe, R9  Featured Event View All
Sep
24
2017
ECASIA #17 – European Conference on Applications of Surface and Interface Analysis - September 24 – 29 Montpellie...
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Products

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PanScan

Designed for easy adaptation, PanScan is a compact, non-magnetic SPM scanner, available in configurations from kits to complete cryogen free low-temperature systems.
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Beetle

The VT Beetle is the most mechanically and thermally stable of the many variable temperature SPM designs on the market today.
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R9plus Control

See what you have been missing. The revolutionary architecture of the R9 provides the highest signal quality and performance in an elegant one-box design.
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Ambient Systems

The intersection of performance and affordability for entering the field UHV SPM. Ambient configurations for bench top measurements.
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Quadraprobe

QuadraProbe offers LT tip and sample, superb SEM resolution, and up to four independently positionable STM or qPlus AFM probes, each providing atomic resolution and electrical measurements.
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Accessories

Designed for maximum compatibility and perfomance to enhance your RHK system.
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From integrating existing equipment, to adding our drop-in SPM Kit or a special turnkey system. RHK partners with you to design and build the ideal solution for your research needs. Contact Us

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Not sure which RHK product is best for your needs? Try choosing by Application or Capability. Still need help? Contact us today!

News & Events
9k Pan Scan FreedomApp Notes
New Application Note for KPFM
9k Pan Scan FreedomNews
RHK Technology Awarded Competitive Grant from the National Science Foundation!

Small Business Innovation Research Program Provides Seed Funding for R&D RHK Technology has been awarded a National Science Foundation (NSF) Small Business Technology Transfer (STTR) grant, in conjunction with Prof. […]

9k Pan Scan FreedomImage of the Month
Scanning Tunneling Microscopy Observation of Phonon Condensate

Reference:
Scientific Reports 7 (2017): 43214

Figure 3. STM images of quasi-freestanding WSe2 islands. (a) STM image of 90 × 75 Å2 area of elevated
1 ML island obtained at 2 V sample bias. (b) Image of the same area at 3 V bias. (c) Cross-section of type-B (multi-ring) pattern from (a). (d) Cross-section of type-A (single-ring) pattern from (a). The STM cross- sections are oriented perpendicular to atomic rows, and the horizontal axes are normalized to a0. The central minima in (c,d) have slightly different shapes due to different contributions of cosine modes (see Discussion part and Supplementary Note 2). (e) The larger scale, 260 × 260 Å2, STM image of phonon interference patterns on elevated 1 ML island. The image uses gradient contrast. One of type-B and one of type-A patterns are schematically surrounded by dotted lines. For gradient contrast, the missing half-rings are less visible. Bright- contrast features originate from residual contaminating particles. (Left inset) The left inset shows different absorption sites for defects, H-site vs. TM-site, that may also cause type-A vs. type-B standing wave patterns. (Right inset) STM image in the right inset clarifies the horizontal axis units in (c,d) and the orientation of crystal axes in (a,b,e). The pattern on this STM image (surrounded by dotted line type-C pattern) only contains a broad central minimum.

9k Pan Scan FreedomEvents
7th International Conference on Nanoscience and Technology

Beijing, China August 29 – August 31. http://www.chinanano.org/ Booths 505-507

RHK Tech Calendar Event Calendar View all
7th International Conference on Nanoscience and Technology
Beijing, China August 29 – August 31. http://www.chinanano.org/ Booths 505-507
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ECASIA #17 –European Conference on Applications of Surface and Interface Analysis
September 24 – 29 Montpellier, France European Conference on Applications of Surface and Interface Analysis The Conference will be held at Le CORUM, Esplanade Charles De Gaulle BP 2220 34000 Montpellier http://www.ecasia2017.com/
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