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Applications
- Overview
- App Notes
Support
News & Events
About RHK
- Overview
- Leadership
- Testimonials
- Careers
- Patents
Contact Us

Events

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December 1, 2015

2015 MRS Fall Meeting Exhibit, Boston, MA

Dec. 1-3
2015 MRS Fall Meeting Exhibit, Boston, MA

Archives

2018

AVS-65 – AVS 65th International Symposium and Exhibition
OSS-18 – On-Surface Synthesis 2018
NC-AFM 2018 – 21st International Conference on Non-contact Atomic Force Microscopy
AVS Prairie Chapter Symposia
ASPM 2018 – Workshop on Advanced Scanning Probe Microscopy
ICN+T 2018 – International Conference on Nanoscience and Technology
UK SPM 2018 – RMS SPM Meeting
PEC 2018 – 78th Physical Electronics Conference
JSM2018 – 74th Annual Meeting of the Japanese Society of Microscopy
Forum 2018
ImagineNano 2018
2018 Joint Meeting of the DPG and EPS Condensed Matter Divisions
APS March Meeting 2018
Surface structures and compositions of Au–Rh bimetallic nanoclusters supported on thin-film Al2O3/NiAl(100) probed with CO
PCSI-45 – 45th Conference on the Physics & Chemistry of Surfaces & Interfaces January 14-18 Kona, HI, US

2017

Real-space visualization of conformation-independent oligothiophene electronic structure
2017 MRS Fall Meeting Exhibit
MMM 2017 – 62nd Annual Conference on Magnetism and Magnetic Materials November 6-9 Pittsburgh, PA, USA
On the critical role of the substrate: the adsorption behaviour of tetrabenzoporphyrins on different metal surfaces
AVS 64th International Symposium & Exhibition
The Quest for Stability: Structural Dependence of Rh(111) on Oxygen Coverage at Elevated Temperature
NC-AFM 2017
ECASIA #17 – European Conference on Applications of Surface and Interface Analysis
RHK Technology Awarded Competitive Grant from the National Science Foundation!
Scanning Tunneling Microscopy Observation of Phonon Condensate
7th International Conference on Nanoscience and Technology
Graphene Visualizes the Ion Distribution on Air-Cleaved Mica
Structure dependent spin selectivity in electron transport through oligopeptides
77th annual Physical Electronics Conference
Chemical vapor deposition growth of bilayer graphene in between molybdenum disulfide sheets
Copper Ion Binding Site in β‐Amyloid Peptide
Latent heat induced rotation limited aggregation in 2D ice nanocrystals
DPG - 2017 Spring Meeting of the Condensed Matter Section
APS 2017 March Meeting
Ultrafast terahertz control of extreme tunnel currents through single atoms on a silicone surface
Angle resolved photoemission spectroscopy reveals spin charge separation in metallic MoSe₂ grain boundary
Multiple charge density wave states at the surface of TbTe₃

2016

MRS Fall 2016
AVS 2016
MMM 2016
Universality of pseudogap and emergent order in lightly doped Mott insulators
Thermally Selective Formation of Subsurface Oxygen in Ag(111) and Consequent Surface Structure
Graphene on SiC, imaging and dI/dV mapping
IVC-20
Temporally and Spatially Resolved Oxidation of Si(111)-(7 Å~ 7) Using Kinetic Energy Controlled Supersonic Beams in Combination with Scanning Tunneling Microscopy
NC AFM 2016
Silicon epitaxy on H-terminated Si (100) surfaces at 250°C
RHK Technology and Quantum Design China announce Dr. Rory Chen has joined QD China as RHK Technology’s Product and Technical Support Manager.
Advanced Materials Characterization Workshop 2016
Origin of a superlattice observed in Li_0.9Mo₆O₁₇ by scanning tunneling microscopy
Double-Stranded Water on Stepped Platinum Surfaces
Coverage-Dependent Self-Assembly Regimes of Alkyl-Substituted Thiophene Oligomers on Au(111): Scanning Tunneling Microscopy and Spectroscopy
RHK Technology Installs First 9K PanScan Freedom System at UNH!
APS 2016 Baltimore
DPG 2016 Regensburg
2016 FLAVS/FSM joint Symposium
SAOG 2016
RHK Technology announces that the cryogen-free PanScan Freedom SPM system is now available in a 9K version
RHK Webinar on SPM Controllers – Unleash your AFM/STM with RHK’s new R9
Redox-Active On-Surface Assembly of Metal-Organic Chains with Single-Site Pt(II)

2015

Hydrogen Terminated Si (100) Studied at Room Temperature in UHV
2015 MRS Fall Meeting Exhibit, Boston, MA
NC-AFM 2015, Cassis, France
Japan Society of Applied Physics
Magnetics Society of Japan
ECOSS-31 – European Conference on Surface Science, Barcelona, Spain
Assembling molecular Sierpiński triangle fractals
Switching Distributions in Magnetic Tunnel Junction Nanopillars Measured with a Scanning Probe
Elevated-temperature STM image collected with the sample held at 425 K showing platinum(II) dipyridyltetrazine 1D chains on the reconstructed Au(100) surface.
Mid infrared plasmon mode observed in doped semiconductor SrTiO3
RHK Technology Highlights the Performance of their PanScan Freedom-LT SPM at the AVS 61st International Symposium
Surface structure of D2O on Pt(111)

2014

Decanethiolates in Self-Assembled Monolayers on Au(111) Studied by Scanning Tunneling Microscopy
PanScan Freedom Helium Free – Closed Cycle Cryostat Scanning Probe Microscope Shows Outstanding Low Noise Performance at AVS 2014 Exhibition
PanScan Freedom Helium Free – Closed Cycle Cryostat Scanning Probe Microscope
RHK Technology, Inc. Appoints Craig Wall as Director of Marketing
RHK Technology, Inc. announces the release of PanScan-Freedom LT
RHK Ships 100th R9 Control System

2013

Surface concentration dependent structures of iodine on Pd(110)
Imaging the Electron-Phonon Interaction at the Atomic Scale
Self-Assembly of Cobalt-Phthalocyanine Molecules on Epitaxial Graphene on Ir(111)
RHK PanScan with Closed Cycle Cryostat shows HOPG atomic resolution at 14 K in initial tests
Revealing the atomic structure of the buffer layer between SiC(0001) and epitaxial graphene
Enhanced Nanoscale Friction on Fluorinated Graphene
Robust Surface Nano-Architecture by Alkali−Carboxylate Ionic Bonding
Imaging of Ti0.87O2 nanosheets using scanning tunneling spectroscopy

2012

UHV Scanning Thermal Microscopy for Nanometer Resolution Quantitative Thermometry
Surface structural evolution during the thermal decomposition of a PdO(101) thin film
Stress-driven structural transformation of Sb-passivated Si(114)
Endotaxial FeSi2 Nanowire on Si(110) surface
Domains of oligopyridine (3,3′-BTP) self assembled monolayers under liquid environment on HOPG.
Formation of Rectangular Packing and One-Dimensional Lines of C60 on 11-Phenoxyundecanethiol Self-Assembled Monolayers on Au(111)
RHK Launches New Website – Further updates in progress, more changes coming soon
RHK Further Boosts Scientist Staff for Scanning Probe Microscopy
RHK Increases Scientific Staff for UHV LT SPM
New Addition to RHK Technical Staff

2011

Phase Fluctuations in a Strongly Disordered s-Wave
RHK wins Air Force Phase II STTR for new Nano-Spectroscopy Platform
Metalloporphyrins on Ag(111)
Four Layer Graphene

2010

STM of Organometallic Structures
STM of Organometallic Structures
Molecular Quantum Lithography
Surface Potential Map of Graphene/SrTiO3
Single 4th generation PAMAM-OH dendrimer

2009

Cu2O-like Island Formations on Cu(100)
Mn on p-GaAs(110)
Tartaric Acid, C4H6O6, Grown on Ag(111)
LCMO: Non-Magnetic at RT, Magnetic at LT

2008

Near-Field and Confocal Raman Microscopy
Zeiss Supra-VP field-emission scanning electron microscope
Monolayer Silica Film with Palladium Atoms
How flat is an air-cleaved mica surface?
Tuning Fork on Silicon
Si(111) on Ag
1,3,5-BTB acid on HOPG
Nanografted Olympic Rings
Sulfite and Sulfate on Ag(111)

2007

PTCDA
Near-field scanning optical microscopy of the InGaN islands
“Oops!” SEM images
Polydiacetylene Nanowires
Adsorbate layer on Pd(111)
Conductive Probe Atomic/Friction Force Microscopy
Charge Density Wave on Cu(111) at 5 K
Azobenzene on Au(111)
Yttrium on Si(100)
BSCCO Superconductor
Monolayer of Methyl Bromide

2006

Si(111) 7×7 Reconstruction
Pb on Si(111)
17 Fe atoms on Cu(111)
Cl-induced etching of Si(100)-(2×1)
Ni3Al(111)
Single Molecule “Nanocar”
Si (111) 7×7 – 130K
Nanotube
LithoEdit DNA
Chlorodecane on Si(111)7×7
STS data on Si(111) at 4K
Octanethiol on Au(111)

2005

Image at Low Temperature with LN2
Indium-enriched islands in a ß2(2×4) reconstruction contrast
Decagonal Al-Ni-Co quasicrystal
NbSe2
NC-AFM – CaF2(111)
6 ML Ni on Ir (100) – (1×1)

Contact Us

RHK Technology, Inc.

1050 East Maple Road
Troy, MI 48083 USA

T 248.577.5426

F 248.577.5433

[email protected]

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