A true low-temperature (10K) UHV 4-Probe system is one of a family of multi-probe UHV SPM systems made possible by RHK Technology. This system provides a complete multi-technique, multi-chamber UHV system and includes all control electronics and software required for a full range of research applications. The base system provides a combination cryogenic 4-probe scanning probe microscope (SPM), an integral scanning electron microscope (SEM), sample preparation, and load-lock introduction for probes and samples. Various optional SEM and surface analysis packages, such as scanning Auger microprobe (SAM), are also available to customize your system for specific research needs.
| · |
Atomic resolution on all four probes |
| · |
True cryogenic (10K) operation on sample and probes for optimal high resolution spectroscopy |
| · |
Independent probe and sample introduction and preparation |
| · |
Advanced control station operation of all four probes |
| · |
Open user-programmable control environment |
| · |
Bath cryostat for low helium consumption |
| · |
Upgrade path to Non-Contact AFM |
| · |
Optional superconducting magnet on sample stage |
| · |
Possible optical excitation by optical fiber |
|
|
QuadraProbe Multisystem at Oak Ridge National Laboratory
4-Probe STM system with high-resolution UHV SEM and scanning Auger analyzer for XPS, UPS, ISS, Auger, and SAM. Its many free ports, separate preparation chamber, and available chamber space will perfectly integrate with planned deposition source extensions.
|
