XPMPro 2.0 Almost Here! Look for us to release Version 2.0 within the next few weeks. Until then read about our features including Spectroscopy Drift Correction and Dynamic Multisampling
New! UHV afm/stm/SEM
Integrated SEM for swift, efficient probe positioning. Uncompromised AFM and STM performance. VT extremes 25 to 1500 K.
2008 Meeting Calendar
June
9-12
MRS International - Chongqing, China
June
11-13
Penn State University 30th Annual Symposium - University Park, PA
June
29-4
14th International Conference on Solid Films and Surfaces - Dublin, Ireland
July
16-18
NSS5 - SPSTM2 Joint International Conference Ohio University - Athens, Ohio
July
21-24
ICN+T 2008 International Conference on Nanoscience + Technology - Keystone, CO
July
27-1
ECOSS-25 - Liverpool, England
August
18-19
Nanoscale Science and Engineering Conference - Oakland University, Rochester, MI
August
18-20
ACS Fall - Philadelphia, PA
September
1-5
NFO10 Near Field Optics Conferenc - Buenos Aires, Argentina
Product Literature and Free Software Download product information and XPMPro™ software. XPMPro™ is our SPM aquisition, analysis and data processing software.
1050 East Maple Road
Troy, MI 48083 USA
Tel: 248-577-5426 Fax: 248-577-5433
Copyright 1996 - 2007, RHK Technology, Inc.