App Notes Overview

Peter Milde and Steffen Porthun
Kelvin Probe Force Microscopy with the RHK R9
1-Institut für Angewandte Photophysik, TU Dresden, D-01069 Dresden, Germany 2-RHK Technology, Inc.
Laurent NONY, Franck PARA, Franck BOCQUET, and Christian LOPPACHER
Integration of the RHK R9 to an Omicron VT-AFM
IM2NP UMR CNRS 7334, Aix-Marseille and Toulon Universités
Rachel Cannara and Robert W. Carpick
The Atomic Force Microscope as a Critical Tool for Research in Nanotribology
Nanomechanics Laboratory, University of Wisconsin
Madison Department of Engineering Physics, Madison, WI 53706
Rajagopal Ramasubramaniam, Ming Jiang and Gregory Snider
Atomic Force Microscope Tip Induced Anodic Oxidation
Department of Electrical Engineering, University of Notre Dame
Kyeongtae Kim, Wonho Jeong, Woochul Lee, and Pramod Reddy
Ultra-High Vacuum Scanning Thermal Microscopy for Nanometer Resolution Quantitative Thermometry
Matthias Temmen, Jannis Lübbe, Michael Reichling
NC-AFM Amplitude Calibration with RHK R9 and a MATLAB Script
Fachbereich Physik, Universität Osnabrück
49076 Osnabrück, Germany
Matthias Temmen, Dirk Rathmann, Rainer Svajda, Michael Reichling
Manual Controller of the Δƒ setpoint in NC-AFM measurements with RHK R9
Fachbereich Physik, Werkstatt für Elektronik und IT,
Universität Osnabrück 49076 Osnabrück, Germany
Cheng Cen
Extending R9 Capability by Programmatic Control with LabVIEW
Department of Physics and Astronomy, West Virginia University,
Morgantown, WV 26506, US
Andrei Kolmakov* and Wayne Goodman**
In situ Scanning Tunneling Microscopy of Individual Supported Metal Nanoclusters at Elevated Pressures and Temperatures
* UCSB, Santa Barbara, CA, USA
** Texas A&M University, College Station, Texas, USA
George Lengel
Low Current Imaging with RHK’s STM Preampliers
RHK Technology, Troy, MI
Zhouhang Wang
RHK Variable Temperature Sample Holder with Built-In Quartz Lamp Heater
RHK Technology, Research and Development