Image of the Month

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Image of the Month
Posted Date: August 1, 2010
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RHEED intensity oscillation monitored on the specular spot during the growth of the LSMO on STO substrate at 900 °C. Inset a1 and a2: RHEED pattern obtained before and after deposition, respectively. (b) Resistivity/magnetization vs temperature curves for LSMO thin films of 5 nm thickness. STM topographic images (1×1 um2) with set point (sample bias 0.7 V, current 0.5 nA) taken at (c) 300 K and (d) 105 K.

Reprinted with permission from Abhimanyu Rana, Kashinath Bogle, Onkar Game, Shankar Patil, Nagarajan Valanoor, and Satishchandra Ogale, APPLIED PHYSICS LETTERS 96, 263108 2010. Copyright 2010, American Institute of Physics.

Microscope:
UHV3500 VT with Variable Magnetic Field

Controls:
RHK SPM 100

Contributors:
Abhimanyu Rana, Kashinath Bogle, Onkar Game, Shankar Patil, Nagarajan Valanoor, and Satishchandra Ogale – NCL, Pune and Univ. of New South Wales

Reference:
APPLIED PHYSICS LETTERS 96, 263108 (2010)

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Image of the Month
Posted Date: July 1, 2010
institution

STM image of organometallic structures formed when dosing phenyl diisocyanide (PDI) on a reconstructed Au(111) surface. The chains that originate at the gold atoms island indicated by the white dash line resemble the shape of a “Nano Spider”. The molecules were dosed from a kundsen type source as described in the following link:
LINK

Imaging conditions: Scan size: 20nm x 20nm. Image taken at room temperature with a tunneling current It=206pA and a sample bias voltabe Vb=-2.0V

Microscope:
UHV750 STM/AFM scan head

Controls:
RHK SPM 100

Contributors:
Jorge A. Boscoboinik, Florencia C. Calaza and Wilfred T. Tysoe. Department of Chemistry and Biochemistry, University of Wisconsin Milwaukee

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Image of the Month
Posted Date: May 1, 2010
iotm-may-2010

Microscope:
RHK Technology UHV 7500 AFM/STM

Surface-deposition of single molecules on the nanometer scale will be crucial for many applications in nanotechnology since even single molecules are expected to serve as functional elements in nanoelectronics, nanooptics, nanomechanics and nanoquantumoptics.

The quantum wave nature of massive objects is already nowadays routinely used to shape and characterize materials on the nanoscale, e.g. in electron microscopy, neutron diffraction or atom interferometry.

Here we report on the first experimental demonstration of quantum interference lithography with complex molecules. Molecular quantum interference patterns are deposited onto a reconstructed Si(111) 7×7 surface and imaged using scanning tunneling microscopy.

Figure 1 shows single C60 molecules deposited onto the surface. In the inset one can even get a glimpse of the inner molecular ring structure.

In figure 2 the white dots represent the coarse grained digitized images of individual molecules. The period of the interference pattern is 267 nm. Both the particle and the quantum wave character of the molecules can thus be visualized in one and the same image when nanolithography becomes part of a sensitive high-resolution detection scheme for quantum interference with large molecules.

Controls:
RHK Technology SPM 1000 Control System featuring XPMPro, PLLPro AFM Control System, and PMC100.

Contributors:
Thomas Juffmann, Stefan Truppe, Philipp Geyer, Andras G. Major, Sarayut Deachapunya, Hendrik Ulbricht, and Markus Arndt – University of Vienna, Burapha University, University of Southampton

Juffmann et al. Phys. Rev. Lett. 103, 263601 (2009)

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Image of the Month
Posted Date: March 1, 2010
iotm-march-2010

Microscope:
RHK Technology UHV 7500 AFM/STM

Kelvin Probe Measurement on graphene exfoliated on SrTiO3 (Strontium titanate) obtained in non-contact AFM mode using a frequency shift of -5 Hz. The graphene was irradiated with Xenon 23+ ions under grazing incidence of 6°. On monolayer the impact of the ions lead to characteristic folding. In Bias-Image the exposed underlying substrate in this area can be clearly seen. Also the monolayer shows lower surface potential difference to SrTiO3 than few monolayers. EFM-Cantilever (Pt coated) from Budget Sensors with resonance frequency of 260 KHz (ElectriTap300-G). The cantilever oscillation amplitude is 22 nm and the data was obtained at room temperature.

Controls:
RHK Technology SPM 1000 Control System featuring XPMPro, PLLPro AFM Control System, and PMC100.

Contributors:
Benedict Kleine Bußmann, Oliver Ochedowski, Marika Schleberger AG Schleberger, University Duisburg-Essen

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