RHK Technology UHV 350
SPM 1000 Control System
Conductive probe atomic / friction force microscopy on silicon pn junction – Topographic, current, and friction images taken at the sample bias of +4V and -4V in contact AFM mode.
Jeong Young Park, Yabing Qi, D. F. Ogletree, P. A. Thiel, and M. Salmeron
Lawrence Berkeley National Laboratory, University of California, Berkeley and Ames Laboratory, Iowa State University