Image of the Month

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Image of the Month
Posted Date: June 1, 2007
institution

Microscope:
RHK Technology UHV 350

Controls:
SPM 1000 Control System

Description :
Conductive probe atomic / friction force microscopy on silicon pn junction – Topographic, current, and friction images taken at the sample bias of +4V and -4V in contact AFM mode.

Jeong Young Park, Yabing Qi, D. F. Ogletree, P. A. Thiel, and M. Salmeron
Lawrence Berkeley National Laboratory, University of California, Berkeley and Ames Laboratory, Iowa State University

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Image of the Month
Posted Date: May 1, 2007
iotm-may-2007

Microscope:
Homebuilt Low Temperature Microscope

Controls:
SPM 1000 Control System W/PLLPro AFM Controller

Description :
Cu(111) imaged with V=20 mV and I=0.3 nA. A defect at the top part of the image produces a standing charge wave with 10 pm corrugation. The underlying copper lattice displays 2 pm corrugation.

B. Albers and U. D. Schwarz – Department of Mechanical Engineering and Center for Research on Interface Structures and Phenomena (CRISP), Yale University

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Image of the Month
Posted Date: April 1, 2007
institution

Microscope:
Homebuilt Low Temperature Microscope

Controls:
SPM 1000 Control System

Description :
Manipulated single azobenzene molecule using several different techniques with a low temperature scanning tunneling microscope (STM).

Operating at a temperature of 34K the isolated azobenzene molecules on the Au(111) surface are selectively and reversibly switched by a 1 microsecond long, -3 V pulse. The imaging parameters are -1.25V, 50 pA.

M. Crommie, M. Comstock, J. Cho, A. Kirakosian

University of California, Berkeley, Lawrence Berkeley National Lab

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Image of the Month
Posted Date: March 1, 2007
institution

Microscope:
RHK QuadraProbe Four-Point Cryogenic Multisystem

Controls:
SPM 1000 Control System

Description :
STM image of yttrium nanowires grown on Si(100). Image was taken at 10 K Sample bias: 2.0 V Tunneling current: 0.18 nA Scan size: 140 nm x 140 nm

Tae-Hwan Kim, An-Ping Li and John Wendelken Center for Nanophase Materials Sciences, Oak Ridge National Laboratory

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