SEM Column in RHK’s UHV AFM/STM/SEM
SPM 1000 Control System featuring XPMProTM
SEM images of two STM tips in the RHK afm/stm/SEM system. The first STM probe crashed into a non-conducting surface which was unable to produce a tunneling current for feedback. However, RHK’s patented insitu tip replacement process allowed the researcher to be back up and running in 5 minutes, saving valuable scan time.
Courtesy of: Zhouhang Wang and Sergiy Pryadkin – RHK Technology, Inc.