Please select the file that you would like to download
> Fill out the information form
> You will then receive an email with a link to our file download page. |
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Our new XPMPro™ software package combines all of the features from our industry leading XPMPro™ software with the user flexibility and powerful Multitasking and Dual-Monitor display capabilities of the latest versions of Windows® XP and 2000.XPMPro™ is unprotected for image processing and analysis allowing it to be installed on multiple computers. |
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| Demo data is useful for practice and to explore the capabilities of the software. |
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1. Translate various file formats, such as Omicron and Digital Instruments to the RHK SM3 format.
2. Translate SM3 binary header format to ASCII for export.
3. Translate SM2 files lacking the .SM2 extention to the SM3 format. |
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Pre-packaged download includes:
XPMPro™, Demo Data, Manual and File Conversion Unility. |
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A contact and a non-contact AFM controller bundled
as one, the PLLPro can simultaneously measure
STM, static AFM defl ection, and the oscillation
properties of the resonating cantilever. Its fully-digital
PLL circuit performs amplitude and phase detection,
and a DSP processor calculates the drive amplitude
and PLL tracking signals. |
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| TOP |
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| Scanning Probe Microscopes |
SPM 1000 Accessories |
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| UHV 300/700 -UHV STM/AFM |
PMC 100 - Inertial Motor Controller |
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| ATM 300/350 - Ambient STM/AFM |
AFM 100 - Beam Deflection Interface |
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| Pico SPM - Controlled Atmosphere STM/AFM |
IVP 200/300 - Low Current STM Preamps |
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| USM 1200/1300 - Unisoku Cryogenic STM/AFM |
V-Scan 100 |
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| Modular System Upgrade Brochure |
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| SPM 1000 - Universal SPM Controller System |
PLLPro - AFM Control Platform |
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| SPM 1000 Control Electronics |
PLLPro Universal Control Platform |
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| SPM 1000 Upgrade |
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| TOP |
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| Low Current Imaging with RHK's STM Preamplifiers |
| PDF |
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| Intermittent-Contact AFM Imaging with RHK Technology Control Systems |
| PDF |
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| Lithographic Atomic Force Microscope Tip induced Anodic Oxidation |
| PDF |
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| Scanning Polorization Force Microscopy |
| PDF |
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| In situ Scanning Tunneling Mircoscopy of Individual Supported Metal Nanoclusters at Elevated Pressures and Temperatures |
| PDF |
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| The Atomic Force Microscope as a Critical Tool for Research in Nanotribology |
| PDF |
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| RHK Variable Temperature Sample Holder with Built-In Quartz Lamp Heater |
| PDF |
| TOP |
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