RHK PanScan

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Image of the Month
Posted Date: March 1, 2010
iotm-march-2010

Microscope:
RHK Technology UHV 7500 AFM/STM

Kelvin Probe Measurement on graphene exfoliated on SrTiO3 (Strontium titanate) obtained in non-contact AFM mode using a frequency shift of -5 Hz. The graphene was irradiated with Xenon 23+ ions under grazing incidence of 6°. On monolayer the impact of the ions lead to characteristic folding. In Bias-Image the exposed underlying substrate in this area can be clearly seen. Also the monolayer shows lower surface potential difference to SrTiO3 than few monolayers. EFM-Cantilever (Pt coated) from Budget Sensors with resonance frequency of 260 KHz (ElectriTap300-G). The cantilever oscillation amplitude is 22 nm and the data was obtained at room temperature.

Controls:
RHK Technology SPM 1000 Control System featuring XPMPro, PLLPro AFM Control System, and PMC100.

Contributors:
Benedict Kleine Bußmann, Oliver Ochedowski, Marika Schleberger AG Schleberger, University Duisburg-Essen

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Image of the Month
Posted Date: February 1, 2010
institution

Microscope:
RHK Technology UHV 300 STM – Ambient STM Imaging and Spectroscopy

The image above is a single 4th generation PAMAM-OH dendrimer. The dendrimer was imaged using a novel metal-ion doping procedure as per C.J. Fleming, Y.X. Liu, Z. Deng, G-y Liu*, J Phys Chem A, 2009, 113, 4168-4174.

The image was obtained at a set point of 0.33 V and 20 pA under ambient conditions using RHK hardware and the new XPM Pro software.

Controls:
RHK Technology SPM 1000 Control System

Contributors:
Christopher J. Fleming, Ying X. Liu, Zhao Deng, and Gang-yu Liu – Department of Chemistry, UniVersity of California, DaVis, California

Reference: C.J. Fleming, Y.X. Liu, Z. Deng, G-y Liu*, J Phys Chem A, 2009, 113, 4168-4174

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Image of the Month
Posted Date: September 1, 2009
iotm-september-2009

Microscope:
RHK Technology UHV 300 VT-STM

Onset of the Cu2O-like island formation on Cu (100) visualized by CCT-STM images recorded after the O2 exposure of 9.4 x 105 L (pO2 =3.7 10-2 mbar, TS=373 K).

Controls:
RHK Technology SPM 1000 Control System

Contributors:
K. Lahtonen, M. Hirsimaki, M. Lampimaki, and M. Valden – Surface Science Laboratory, Tampere University of Technology

Reference: THE JOURNAL OF CHEMICAL PHYSICS 129, 124703 2008

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Image of the Month
Posted Date: August 1, 2009
institution

Topography of three substituted Mn acceptors in the first layer of p-GaAs(110) surface

Microscope:
Custom-Built Low Temperature UHV STM
Temperature: > 7.3K
Vacuum: < 1×10-10 torr
High Tunnel Junction Stability < 2pm

Controls:
RHK Technology SPM 1000 Control System

Contributors:
Donghun Lee, David Daughton and Dr. Jay Gupta The Gupta group, Dept. of Physics, the Ohio State University

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