RHK PanScan

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Image of the Month
Posted Date: May 1, 2009
iotm-may-2009

The image was taken at 50 mV and 100 pA, and at 83 K, with a home-built STM operating in constant current mode. It shows a multilayer structure for (/S/,/S/)-tartaric acid, C4H6O6, grown on Ag(111). Each bright oval in the first layer, along with each bright circle in the overlayer, corresponds to a single tartaric acid molecule. The feature along the right side of the image is a single Ag(111) step.

Microscope:
Home-Built STM Operating in Constant Current Mode

Controls:
RHK Technology SPM 1000 Control System

Contributors:
Nancy Santagata, Pengshun Luo, Amit Lakhani, Darryl Dewitt, B. Scott Day, Michael Norton, Thomas Pearl
Pearl Group – Department of Physics, North Carolina State University

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Image of the Month
Posted Date: March 1, 2009
iotm-march-2009

At room temperature the sample shows no magnetic features. When the sample is cooled the LCMO goes through a phase transition and becomes magnetic. The sample has then reached temperatures below 250K.

LCMO, “On/Off”
The sample in the image below has been cooled to 195K. The direction of the magnetic “strips” change as the magnetic field is turned on and off.

LCMO, “Ramped Up “
The sample in the image below has been cooled to 195K. The magnetic “strip” fades as the magnetic field is turned up.

Microscope:
RHK Variable Magnetic Field, Cryogen-Free, UHV AFM/STM

Controls:
RHK Technology SPM 1000 Control System

Contributors:
RHK Technology, Inc.
Zhouhang Wang, Adam Kollin, Sergiy Pryadkin, Gennady Royzenblat

Sample Provided By:
India Institute of Technology, Kanpur
Professor Ramesh Budhani, Mr. Gyanendra Singh

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Image of the Month
Posted Date: December 1, 2008
institution

Microscope:
Homebuilt

Controls:
RHK Technology SPM 1000 Control System

Description:
The topography and near-field images were obtained with shear-force microscopy using a chemically etched gold tip attached to a quartz tuning fork. The confocal Raman instrument used in this experiment is based on an inverted optical microscope equipped with an x,y-scan stage. A high numerical aperture objective (1.4 NA) is used to focus a radially polarized laser beam with wavelength 785nm on the sample surface. The scattered light is collected using the same objective and then detected with a single-photon counting avalanche photodiode (APD). The images lateral sizes are 5 micra.

The sample is a self-organized carbon nanotube serpentine on a quartz substrate produced by Prof. Ernesto Joselevich’s group, at the Weizmann Institute of Science.

Gustavo Cancado and Lukas Novotny
Institute of Optics, University of Rochester

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Image of the Month
Posted Date: October 1, 2008
iotm-october-2008

Microscope:
Zeiss Supra-VP field-emission scanning electron microscope

Controls:
RHK Technology SPM 1000 Control System with XPMPro Software

Description:
Sample: MOCVD-grown GaN nanowires and structures on GaN film, sapphire substrate. Images: “Topographic”Secondary electron (SEM) image acquired with in-lens detector, and cathodoluminescence (CL) image acquired using a Hammamatsu photomultiplier tube (quantum efficiency 3 to 30% between 300 and 600 nm) in pulse-counting mode. 1 ms/pixel with CL count rates up to 1.8 MHz. image size set by SEM, 110 mm / 7500 = 14 um

Reference:
Frank Ogletree, Shaul Aloni and Tev Kuykendall Molecular Foundry, Lawrence Berkeley National Lab

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