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Image of the Month
Posted Date: May 1, 2010
iotm-may-2010

Microscope:
RHK Technology UHV 7500 AFM/STM

Surface-deposition of single molecules on the nanometer scale will be crucial for many applications in nanotechnology since even single molecules are expected to serve as functional elements in nanoelectronics, nanooptics, nanomechanics and nanoquantumoptics.

The quantum wave nature of massive objects is already nowadays routinely used to shape and characterize materials on the nanoscale, e.g. in electron microscopy, neutron diffraction or atom interferometry.

Here we report on the first experimental demonstration of quantum interference lithography with complex molecules. Molecular quantum interference patterns are deposited onto a reconstructed Si(111) 7×7 surface and imaged using scanning tunneling microscopy.

Figure 1 shows single C60 molecules deposited onto the surface. In the inset one can even get a glimpse of the inner molecular ring structure.

In figure 2 the white dots represent the coarse grained digitized images of individual molecules. The period of the interference pattern is 267 nm. Both the particle and the quantum wave character of the molecules can thus be visualized in one and the same image when nanolithography becomes part of a sensitive high-resolution detection scheme for quantum interference with large molecules.

Controls:
RHK Technology SPM 1000 Control System featuring XPMPro, PLLPro AFM Control System, and PMC100.

Contributors:
Thomas Juffmann, Stefan Truppe, Philipp Geyer, Andras G. Major, Sarayut Deachapunya, Hendrik Ulbricht, and Markus Arndt – University of Vienna, Burapha University, University of Southampton

Juffmann et al. Phys. Rev. Lett. 103, 263601 (2009)

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Image of the Month
Posted Date: March 1, 2010
iotm-march-2010

Microscope:
RHK Technology UHV 7500 AFM/STM

Kelvin Probe Measurement on graphene exfoliated on SrTiO3 (Strontium titanate) obtained in non-contact AFM mode using a frequency shift of -5 Hz. The graphene was irradiated with Xenon 23+ ions under grazing incidence of 6°. On monolayer the impact of the ions lead to characteristic folding. In Bias-Image the exposed underlying substrate in this area can be clearly seen. Also the monolayer shows lower surface potential difference to SrTiO3 than few monolayers. EFM-Cantilever (Pt coated) from Budget Sensors with resonance frequency of 260 KHz (ElectriTap300-G). The cantilever oscillation amplitude is 22 nm and the data was obtained at room temperature.

Controls:
RHK Technology SPM 1000 Control System featuring XPMPro, PLLPro AFM Control System, and PMC100.

Contributors:
Benedict Kleine Bußmann, Oliver Ochedowski, Marika Schleberger AG Schleberger, University Duisburg-Essen

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Image of the Month
Posted Date: February 1, 2010
institution

Microscope:
RHK Technology UHV 300 STM – Ambient STM Imaging and Spectroscopy

The image above is a single 4th generation PAMAM-OH dendrimer. The dendrimer was imaged using a novel metal-ion doping procedure as per C.J. Fleming, Y.X. Liu, Z. Deng, G-y Liu*, J Phys Chem A, 2009, 113, 4168-4174.

The image was obtained at a set point of 0.33 V and 20 pA under ambient conditions using RHK hardware and the new XPM Pro software.

Controls:
RHK Technology SPM 1000 Control System

Contributors:
Christopher J. Fleming, Ying X. Liu, Zhao Deng, and Gang-yu Liu – Department of Chemistry, UniVersity of California, DaVis, California

Reference: C.J. Fleming, Y.X. Liu, Z. Deng, G-y Liu*, J Phys Chem A, 2009, 113, 4168-4174

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Image of the Month
Posted Date: September 1, 2009
iotm-september-2009

Microscope:
RHK Technology UHV 300 VT-STM

Onset of the Cu2O-like island formation on Cu (100) visualized by CCT-STM images recorded after the O2 exposure of 9.4 x 105 L (pO2 =3.7 10-2 mbar, TS=373 K).

Controls:
RHK Technology SPM 1000 Control System

Contributors:
K. Lahtonen, M. Hirsimaki, M. Lampimaki, and M. Valden – Surface Science Laboratory, Tampere University of Technology

Reference: THE JOURNAL OF CHEMICAL PHYSICS 129, 124703 2008

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