RHK PanScan

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Image of the Month
Posted Date: October 1, 2008
iotm-october-2008

Microscope:
Zeiss Supra-VP field-emission scanning electron microscope

Controls:
RHK Technology SPM 1000 Control System with XPMPro Software

Description:
Sample: MOCVD-grown GaN nanowires and structures on GaN film, sapphire substrate. Images: “Topographic”Secondary electron (SEM) image acquired with in-lens detector, and cathodoluminescence (CL) image acquired using a Hammamatsu photomultiplier tube (quantum efficiency 3 to 30% between 300 and 600 nm) in pulse-counting mode. 1 ms/pixel with CL count rates up to 1.8 MHz. image size set by SEM, 110 mm / 7500 = 14 um

Reference:
Frank Ogletree, Shaul Aloni and Tev Kuykendall Molecular Foundry, Lawrence Berkeley National Lab

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Image of the Month
Posted Date: August 1, 2008
institution

Microscope:
Home Built Low Temperature STM (10K)

Controls:
SPM 1000 Control System with the IVP 300

Description:
The images show a monolayer silica film with palladium atoms (the bright spots) sitting in the holes of the film.

Reference: ChemPhysChem 2008, 9, 1367 – 1370
Stefan Ulrich, Niklas Nilius, Hans-Joachim Freund, Umberto Martinez, Livia Giordano, and Gianfranco Pacchioni – Fritz-Haber-Institut der MPG Berlin and Universit di Milano-Bicocca

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Image of the Month
Posted Date: July 1, 2008
institution

Microscope:
RHK UHV 7500

Controls:
SPM 1000 Control System

Description :
Large regularly shaped islands on air-cleaved mica surfaces after degassing in UHV at 473 K for 14 h recorded in the constant detuning mode. NC-AFM images recorded in the constant detuning mode. The profiles shown below the images are cross-sections taken along the indicated lines. (a) Island of 1.7 nm height with regular shape. Image taken at a detuning of -7.3 Hz and a bias voltage of 0 V. (b) Island of 5 nm height. The extended bright lobes in the centre of this structure are a scanning artefact. Image taken at a detuning of -4.0 Hz and a bias voltage of -1.3 V. (c) Zoom into the structure marked by the square in frame (b) revealing three terraces. Image taken at a detuning of -22.1 Hz and a bias voltage of 0 V.

Courtesy of:
F. Ostendorf, C. Schmitz, S. Hirth, A. Kuhnle, J. J. Kolodziej, and M. Reichling

Universitat Osnabruck, Research Centre for Nanometer-Scale Science and Advanced Materials (NANOSAM), and Jagiellonian University

Reference: Nanotechnology 19 (2008) 305705 (6pp)

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Image of the Month
Posted Date: May 1, 2008
iotm-may-2008

Microscope:
RHK UHV 325

Controls:
SPM 1000 and PLLPro SPM Control Systems

Description :
True constant height image with current and ΔF(Hz) acquisition amplitude of oscillation, 3Å peak to peak.

Courtesy of:
Sergiy Pryadkin of RHK Technology

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