Homebuilt Low Temperature Microscope
SPM 1000 Control System W/PLLPro AFM Controller
Cu(111) imaged with V=20 mV and I=0.3 nA. A defect at the top part of the image produces a standing charge wave with 10 pm corrugation. The underlying copper lattice displays 2 pm corrugation.
B. Albers and U. D. Schwarz – Department of Mechanical Engineering and Center for Research on Interface Structures and Phenomena (CRISP), Yale University