 |
|
| |
|
TROY, MI, January 14, 2009 - RHK Technology, Inc. an integrated surface science solution manufacturer, recently hired Stefan Ulrich to design and develop next generation scanning probe microscopy platforms for science and nanotechnology research.
Mr. Ulrich brings valuable expertise to RHK in the field of low-temperature scanning probe microscopy (LT-SPM). His experience includes over five years of hands-on design, construction, and use of advanced LT-SPM research systems.
Mr. Ulrich is completing his Ph.D. in Physics at the Fritz-Haber-Institute of the Max-Planck-Society, where he was a member of the Scanning Probe Microscopy Group in the Chemical Physics Department.
RHK Technology develops and manufactures a complete line of scanning probe microscopes for the performance and customization needs of research scientists around the world. The SPM industry leader in innovation, reliability, open architecture, and customer support, RHK has delivered a consistently superior product for twenty years. Our newest products bolster a reputation for uncompromised excellence.
For further information please contact Allen Vallei of RHK Direct.
Vallei@rhk-tech.com or (248) 577-5426
|
  |
|
