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prodArrowSliderBeetle UHV VT AFM/SEM

See what you have been missing with correlative SEM and AFM microscopies

Beetle UHV VT AFM/SEM Overview

How Do You Bridge the Gap Between Resolution and Field of View?

A 100 nm particle sounds vast in our nano-research world. But searching for a feature even that size on a 10-20 mm2 SPM sample can be futile. It is far too small for optical imaging to assist navigation, and scanning with an SPM can waste valuable research time. How do you bridge the gap between optical and SPM techniques to assure productive results?  RHK Provides the Solution: Meet the UHV Probe Positioning System. Swift SEM-guided probe placement in a wide field of view, integrated with uncompromised AFM/STM resolution.

RHK puts your Science On Target.

A fully integrated SEM onboard our renowned UHV AFM/STM.  Best-of-breed analytical and preparation instruments are thoughtfully configured and integrated across hardware, software, electrical, and control interfaces.

Beetle AFM/SEM Quick Specifications

  • Integrated SEM for Swift, Efficient Probe Positioning
  • Uncompromised AFM and STM Performance
  • Beetle-Design Scan Head: Inherently Stiff, Mechanically and Thermally Stable
  • VT Extremes from 25 K to 1500 K
  • Highly Evolved SPM Control System
  • Modular Analytical and Sample Preparation Options
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Beetle UHV VT AFM/SEM Gallery

  • Beetle SEM SPM chamber detail

  • Beetle SEM system overhead view

  • Beetle SEM system photo above frame only

  • Beetle SEM system views

  • Beetle with on-board SEM

  • Beetle with Orsay SEM illustration

  • Beetle-SEM interior SPM chamber view

Beetle UHV VT AFM/SEM Specifics

  • Inherent Mechanical and Thermal Stability due to small mechanical and thermal loop, inherently stiff and compact Beetle design, and symmetrical geometry. Thermal drift <1 Å/min
  • Easy day-to-day use without frustration of others’ more complex and less intuitive approach
  • Integrated SEM for Swift, Efficient Probe Positioning
  • Uncompromised AFM and STM Performance
  • Beetle-Design Scan Head: Inherently Stiff, Mechanically and Thermally Stable
  • VT Extremes from 25 K to 1500 K
  • Highly Evolved SPM Control System
  • Modular Analytical and Sample Preparation Options
  • Coarse XY positioning at least 5 mm x 5 mm
  • Scan range of at least 5 micron x 5 micron XY
  • Minimum resolution of 0.5Å (X, Y) and 0.1Å (Z).
  • Thermal drift <1 Å/min
  • Sample temperatures: from 25 K (LHe) to >1500 K; or 100 K (LN2) to >1500 K
  • Beetle sample holder uniquely provides true and accurate sample temperature measurement via thermocouple in direct contact with sample itself.
  • Sample temperatures from 25 K to >1500 K on SPM sample stage and on manipulator stages in preparation/analysis chambers
  • Sample temperature while imaging: 750 K for AFM, 1000 K for STM
  • 6 electrical contacts to sample holder (2 for temperature, 2 for heating, 2 for auxiliary use such as BEEM). A single holder conveniently supports all heating and cooling modes – radiative, e-beam, resistive/DC; LN2 and LHe
  • Sample holders also available for Cleaving; delivering RF signal to sample; and heating in reactive gases via Quartz Bulb or Ceramic Button
  • Sample size 10mm diameter
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