Microscope:
RHK UHV 7500 AFM

Controls:
RHK SPM 1000 and PLLPro™

Description:
Here we describe a method where a dynamic force microscope operated in non-contact mode is utilized to induce a directed, atomic precision lateral movement of defects on an insulator surface, namely the (111) surface of CaF2.


Courtesy of Sabine Hirth, Frank Ostendorf, Michael Reichling Fachbereich Physik, Universität Osnabrück


Back to Results