Microscope:
SEM Column in RHK's UHV AFM/STM/SEM

Controls:
SPM 1000 Control System featuring XPMPro^TM

Description :
SEM images of two STM tips in the RHK afm/stm/SEM system. The first STM probe crashed into a non- conducting surface which was unable to produce a tunneling current for feedback. However, RHK's patented insitu tip replacement process allowed the researcher to be back up and running in 5 minutes, saving valuable scan time.

Courtesy of: Zhouhang Wang and Sergiy Pryadkin - RHK Technology, Inc.

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