 |
|
As nanotechnology continues to blossom the need to study small particles on an atomic scale grows in importance. The fundamental problem to solve is how to place your AFM/STM probe over the feature quickly and efficiently. A few years ago, this was accomplished using a high-magnification video camera to direct the tip to the location of interest. However, this technique is unuseable when features are less than a few micrometers.
Introducing the solution to this problem, an integrated SEM column with the world-leading AFM/STM model, the RHK Technology UHV350 SPM. Spend your valuable time doing research and not on a hunting expedition.
|
|
 |
Integrated SEM for Swift, Efficient Probe Positioning
Beetle-Design Scan Head: Inherently Stiff, Mechanically and Thermally Stable
VT Extremes from 25 K to 1500 K
Highly Evolved SPM Control System
Modular Analytical and Sample Preparation Options
 |
Every month RHK acknowledges researchers that produce aestetically gratifying images. |
|
RHK unites the speed and convenience of SEM-guided probe placement with uncompromised VT-AFM/STM performance.
|
With both particle and probe in the SEM’s outstanding field of view, navigating tip to feature is fast and sure.
|
Accelerate your research. Concentrate on breakthroughs in nanoscience, not slowly searching for particles. |
| |
|
|
