When enabled, software will automatically correct for drift in all three axes between multiple spectroscopy curves taken at the same location. At present XPMPro can correct for drift between curves only in the Z axis. Exact location of spectroscopic measurement will be stored.
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The surface is scanned to show a general topographical layout.
The user then chooses a reference feature and outline it with a small box.
The user then draws a second box roughly 3 times the size of the feature.
Spectroscopy is then taken on the target feature for a given period of time.
The large box is then scanned quickly to determine if the target feature is in a different location.
XPMPro compares the two images and calculates the offset in order to determine the new location of the target.
XPMPro automatically moves the tip to the new target location
Product Literature and Free Software Download product information and XPMPro™ software. XPMPro™ is our SPM aquisition, analysis and data processing software.
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