Image of the Month

September 2012

Stress-driven structural transformation of Sb-passivated Si(114)

Microscope: RHK Technology UHV300
Control System: RHK Technology SPM 1000

Credits:

Hidong Kima, Otgonbayar Dugerjava,Ganbat Duvjir a, Huiting Lia, Seunghun Jangb, Moonsup Hanb, B.D. Yub, Jae M. Seoa

a Department of Physics and Institute of Photonics and Information Technology, Chonbuk National University, Jeonju 561-756, Republic of Korea

b Department of Physics, University of Seoul, Seoul 130-743, Republic of Korea

Reference: H. Kim et al. / Surface Science 606 (2012) 312–319