RHK Technology UHV 7500 AFM/STM
Kelvin Probe Measurement on graphene exfoliated on SrTiO3 (Strontium titanate) obtained in non-contact AFM mode using a frequency shift of -5 Hz. The graphene was irradiated with Xenon 23+ ions under grazing incidence of 6°. On monolayer the impact of the ions lead to characteristic folding. In Bias-Image the exposed underlying substrate in this area can be clearly seen. Also the monolayer shows lower surface potential difference to SrTiO3 than few monolayers. EFM-Cantilever (Pt coated) from Budget Sensors with resonance frequency of 260 KHz (ElectriTap300-G). The cantilever oscillation amplitude is 22 nm and the data was obtained at room temperature.
RHK Technology SPM 1000 Control System featuring XPMPro, PLLPro AFM Control System, and PMC100.
Benedict Kleine Bußmann, Oliver Ochedowski, Marika Schleberger AG Schleberger, University Duisburg-Essen