Application Notes and Case Studies Overview
Integration of the RHK R9 Controller for Tip-Enhanced Photoluminescence (TEPL) Spectroscopy and Imaging
Integration of the RHK Panscan SPM Scan Head into Customers’ Home-Built Systems
Kelvin Probe Force Microscopy with the RHK R9
1-Institut für Angewandte Photophysik, TU Dresden, D-01069 Dresden, Germany 2-RHK Technology, Inc.
Integration of the RHK R9 to an Omicron VT-AFM
IM2NP UMR CNRS 7334, Aix-Marseille and Toulon Universités
The Atomic Force Microscope as a Critical Tool for Research in Nanotribology
Nanomechanics Laboratory, University of Wisconsin
Madison Department of Engineering Physics, Madison, WI 53706
Madison Department of Engineering Physics, Madison, WI 53706
Atomic Force Microscope Tip Induced Anodic Oxidation
Department of Electrical Engineering, University of Notre Dame
Ultra-High Vacuum Scanning Thermal Microscopy for Nanometer Resolution Quantitative Thermometry
NC-AFM Amplitude Calibration with RHK R9 and a MATLAB Script
Fachbereich Physik, Universität Osnabrück
49076 Osnabrück, Germany
49076 Osnabrück, Germany
Manual Controller of the Δƒ setpoint in NC-AFM measurements with RHK R9
Fachbereich Physik, Werkstatt für Elektronik und IT,
Universität Osnabrück 49076 Osnabrück, Germany
Universität Osnabrück 49076 Osnabrück, Germany
Extending R9 Capability by Programmatic Control with LabVIEW
Department of Physics and Astronomy, West Virginia University,
Morgantown, WV 26506, US
Morgantown, WV 26506, US
In situ Scanning Tunneling Microscopy of Individual Supported Metal Nanoclusters at Elevated Pressures and Temperatures
* UCSB, Santa Barbara, CA, USA
** Texas A&M University, College Station, Texas, USA
** Texas A&M University, College Station, Texas, USA
RHK Variable Temperature Sample Holder with Built-In Quartz Lamp Heater
RHK Technology, Research and Development