Image of the Month

June 2007

Conductive Probe Atomic/Friction Force Microscopy


RHK Technology UHV 350

SPM 1000 Control System

Description :
Conductive probe atomic / friction force microscopy on silicon pn junction – Topographic, current, and friction images taken at the sample bias of +4V and -4V in contact AFM mode.

Jeong Young Park, Yabing Qi, D. F. Ogletree, P. A. Thiel, and M. Salmeron
Lawrence Berkeley National Laboratory, University of California, Berkeley and Ames Laboratory, Iowa State University