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February 2015

Mid infrared plasmon mode observed in doped semiconductor SrTiO3

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Mid infrared plasmon mode observed in doped semiconductor SrTiO3 fabricated by Argon ion etching. Color represents near field optical signal, which is overlaid on top of the topography profile in a 24µm square area.

The image is obtained by a RHK broadband variable temperature scanning near field optical microscope.

Credits: Professor Cheng Cen, Department of Physics and Astronomy, West Virgina University, Morgantown, WV

Microscope: RHK broadband variable temperature scanning near field optical microscope.

Control System: RHK R9-STM and PMC100

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