Press Releases

March 14, 2012

RHK Further Boosts Scientist Staff for Scanning Probe Microscopy

TROY, MI, March 14, 2011

RHK Technology, Inc. has hired Dr. Ryan Murdick as a Staff Scientist, further boosting its expertise and resources for innovative SPM products. Dr. Murdick brings over six years of hands-on experimental materials science experience, including measurement techniques, cryo-cooling applications, and semiconductor physics and nonlinear/ultrafast optics. He is already deeply involved with several breakthrough product-development projects at RHK.

Formerly with the University of Washington Nano-Optics Physics group, Dr. Murdick specialized in both non-linear optics and SPM. At UW he constructed a low temperature/high vacuum atomic force microscope (AFM) coupled to a pulsed infrared laser source for scattering-type scanning near-field optical microscopy.

His previous experience also includes PNNL, where he led the complex s-SNOM (apertureless) system project. He brought this project to completion two months ahead of schedule and 30% under budget. At PNNL he also led a successful project for cutting-edge preliminary measurements on metal oxides undergoing metal-to-insulator phase transitions.

Dr. Murdick earned his Ph.D. in Physics at Michigan State University in 2009.